Comparative analysis of copper X-radiation intensity with LiF and KBr crystals
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DOI:
https://doi.org/10.54355/tbusphys/2.1.2024.0007Keywords:
X-ray spectroscopy, Bragg angle, copper X-radiation, crystallographic phenomena, energy determinationAbstract
Corrigendum Notice: A corrigendum has been issued for this article and is included at the end of this document. Referred to by:
The intensity of copper X-radiation has been scrutinized as a function of the Bragg angle, employing both LiF and KBr crystals. X-ray intensity spectra were recorded for Cu as a function of Bragg angle using LiF, KBr single crystals using a PHYWE X-Ray Expert Unit (35 kV, 1 mA) with an X-ray goniometer, Plug-in Cu X-ray tube and a 2.2 mm diameter aperture tube. The scanning range was chosen to be 4°-55° for LiF and 3°-75° for KBr. The resultant spectra furnish a comprehensive portrayal of the variation in X-ray emission intensity relative to alterations in the Bragg angle. This investigation contributes to our comprehension of crystallographic phenomena and underscores the efficacy of diverse crystalline materials in X-ray diffraction studies. Precise determinations of the energy levels for characteristic copper X-ray lines have been obtained, revealing E (Kβ) = 8868.374 ± 30.474 eV and (Kα) = 8026.349 ± 31.634 eV. These findings accentuate the significance of X-ray spectroscopy in delineating the elemental composition and structural attributes of materials, while also affirming the role of theoretical predictions in elucidating experimental observations.
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