WEI, Z. Machine-learning-assisted modeling of defect-mediated charge transport in anisotropic 2D semiconductors. Technobius Physics, [S. l.], v. 4, n. 2, p. 0051, 2026. DOI: 10.54355/tbusphys/30070147.4.2.2026.0051. Disponível em: https://technobius.kz/index.php/phys/article/view/365. Acesso em: 29 jun. 2026.