SHARIPOV, A. Statistical properties and scaling of 1/f noise in disordered nicr thin-film resistors. Technobius Physics, [S. l.], v. 3, n. 4, p. 0044, 2025. DOI: 10.54355/tbusphys/3.4.2025.0044. Disponível em: https://technobius.kz/index.php/phys/article/view/326. Acesso em: 25 jan. 2026.